Grating enhanced apertureless near-field optical microscopy
نویسندگان
چکیده
منابع مشابه
Field enhancement in apertureless near-field scanning optical microscopy.
The near field of an apertureless near-field scanning optical microscopy probe is investigated with a multiple-multipole technique to obtain optical fields in the vicinity of a silicon probe tip and a glass substrate. The results demonstrate that electric field enhancements of >15 relative to the incident fields can be achieved near a silicon tip, implying intensity enhancements of several orde...
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Polarization properties of apertureless-type scanning near-field optical microscopy (a-SNOM) were measured experimentally and were also analyzed using a finite-difference time-domain (FDTD) simulation. Our study reveals that the polarization properties in the a-SNOM are maintained and the a-SNOM works as a wave plate expressed by a Jones matrix. The measured signals obtained by the lock-in dete...
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We have performed measurements on terahertz (THz) apertureless near-field microscopy that show that the temporal shape of the observed near-field signals is approximately proportional to the time-integral of the incident field. Associated with this signal change is a bandwidth reduction by approximately a factor of 3 which is observed using both a near-field detection technique and a far-field ...
متن کاملApertureless near-field optical microscope
We demonstrate a new method whereby near-field optical microscope resolution can be extended to the nanometer regime. The technique is based on measuring the modulation of the scattered electric field from the end of a sharp silicon tip as it is stabilized and scanned in close proximity to a sample surface. Our initial results demonstrate resolution in the 3 nm range--comparable to what can be ...
متن کاملTip-enhanced near-field optical microscopy.
Spectroscopic methods with high spatial resolution are essential for understanding the physical and chemical properties of nanoscale materials, including quantum structures and biological surfaces. An optical technique is reviewed that relies on the enhanced electric fields in the proximity of a sharp, laser-irradiated metal tip. These fields are utilized for spatially confined probing of vario...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2015
ISSN: 1094-4087
DOI: 10.1364/oe.23.018401